ICU-12582 Turn off sporadically failing test

X-SVN-Rev: 38829

diff --git a/icu4j/main/tests/core/src/com/ibm/icu/dev/test/format/DateFormatRoundTripTest.java b/icu4j/main/tests/core/src/com/ibm/icu/dev/test/format/DateFormatRoundTripTest.java
index dc463a590c13be95eb450d00dcabc52d000a41e3..fc0cf235bc1c49daf0eee98e4233c0c76fa4b6f1 100644 (file)
--- a/icu4j/main/tests/core/src/com/ibm/icu/dev/test/format/DateFormatRoundTripTest.java
+++ b/icu4j/main/tests/core/src/com/ibm/icu/dev/test/format/DateFormatRoundTripTest.java
@@ -18,6 +18,7 @@ import java.util.Date;
 import java.util.Locale;
 import java.util.Random;
 
+import org.junit.Ignore;
 import org.junit.Test;
 
 import com.ibm.icu.text.DateFormat;
@@ -39,6 +40,8 @@ public class DateFormatRoundTripTest extends com.ibm.icu.dev.test.TestFmwk {
     private int DEPTH = 5;
     private Random ran;
 
+    // TODO: test is randomly failing depending on the randomly generated date
+    @Ignore
     @Test
     public void TestDateFormatRoundTrip() {
         dateFormat = new SimpleDateFormat("EEE MMM dd HH:mm:ss.SSS zzz yyyy G");
@@ -71,7 +74,7 @@ public class DateFormatRoundTripTest extends com.ibm.icu.dev.test.TestFmwk {
         }
     }
     
-    public String styleName(int s) {
+    private String styleName(int s) {
         switch (s) {
             case DateFormat.SHORT :
                 return "SHORT";
@@ -255,13 +258,13 @@ public class DateFormatRoundTripTest extends com.ibm.icu.dev.test.TestFmwk {
         }
     }
     
-    public int getField(Date d, int f) {
+    private int getField(Date d, int f) {
         getFieldCal.setTime(d);
         int ret = getFieldCal.get(f);
         return ret;
     }
     
-    public Date generateDate() {
+    private Date generateDate() {
         double a = ran.nextDouble();
         // Now 'a' ranges from 0..1; scale it to range from 0 to 8000 years
         a *= 8000;