[CodeGen] Fix typos to run tests. NFC.

git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@371286 91177308-0d34-0410-b5e6-96231b3b80d8

diff --git a/test/CodeGen/PowerPC/store-combine.ll b/test/CodeGen/PowerPC/store-combine.ll
index ed8f2309c37f6957bc125d054275f19f157ef6bd..b168a8e637c9b1ec23130f2f0bec99666a229746 100644 (file)
--- a/test/CodeGen/PowerPC/store-combine.ll
+++ b/test/CodeGen/PowerPC/store-combine.ll
@@ -234,8 +234,8 @@ entry:
   %conv28 = trunc i64 %shr26 to i8
   store i8 %conv28, i8* %p, align 1
   ret void
-; CEHCK-PPC64LE: stdbrx [[REG2]], 0, 4
-; CEHCK-PPC64: stdx [[REG2]], 0, 4
+; CHECK-PPC64LE: stdbrx [[REG2]], 0, 4
+; CHECK-PPC64: stdx [[REG2]], 0, 4
 }
 
 ; One of the stores is volatile