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(parent: 74d47a8) | patch
Enable unit test for partial 16x16 inverse 2D-DCT
authorJingning Han <jingning@google.com>
Wed, 28 May 2014 18:18:33 +0000 (11:18 -0700)
committerJingning Han <jingning@google.com>
Wed, 4 Jun 2014 02:06:39 +0000 (19:06 -0700)
commit7eaad70bf771e5e28f21863f6b316770f0779d24
treec73bb2b5ba77f785ddc96b52d633b759611022cbtree | snapshot
parent74d47a8132288511be97a4d2326debd2fe0dc03bcommit | diff
Enable unit test for partial 16x16 inverse 2D-DCT

This commit enables unit test for SSSE3 16x16 inverse 2D-DCT with
10 non-zero coefficients. It includes a new test condition to
cover the potential overflow issue due to extremely coarse quantization.

Change-Id: I945e16f05dfbe19500f0da5f15990feba8e26d99
test/partial_idct_test.cc diff | blob | history
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