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(parent: ec4fbc6) | patch
[2/6] ARM Neon Intrinsic Tablegen Test Generator.
authorMichael Gottesman <mgottesman@apple.com>
Tue, 16 Apr 2013 21:18:42 +0000 (21:18 +0000)
committerMichael Gottesman <mgottesman@apple.com>
Tue, 16 Apr 2013 21:18:42 +0000 (21:18 +0000)
commit21e4e940ed3ad172f344a3aa3faf1d8437441313
tree40a437ae47ac7466d033c23f4f778a937e4fe8cdtree | snapshot
parentec4fbc6144c1edcd82ec71a16ee3d0dfb94dfeaecommit | diff
[2/6] ARM Neon Intrinsic Tablegen Test Generator.

This patch causes OpInst records to be silently identified with their Non-Op
inst counterparts so that the same test generation infrastructure can be used to
generate tests.

Reviewed by Bob Wilson.

git-svn-id: https://llvm.org/svn/llvm-project/cfe/trunk@179628 91177308-0d34-0410-b5e6-96231b3b80d8
utils/TableGen/NeonEmitter.cpp diff | blob | history
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