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(parent: 15d311b) | patch
esp_flash: add unit test for external flash and QE toggling
authorMichael (XIAO Xufeng) <xiaoxufeng@espressif.com>
Wed, 4 Sep 2019 13:09:30 +0000 (21:09 +0800)
committerMichael (XIAO Xufeng) <xiaoxufeng@espressif.com>
Mon, 14 Oct 2019 09:25:58 +0000 (17:25 +0800)
commit1e1d50376b04e7ce66e0a2ef9fd0c1a3fe8e56a0
tree8ffd8dc5283f5122750e5d8ffa33cc9f56ee3949tree | snapshot
parent15d311bb80ecd9191fcabd4a846711b433c4448ccommit | diff
esp_flash: add unit test for external flash and QE toggling

Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
components/spi_flash/test/test_esp_flash.c diff | blob | history
tools/ci/config/target-test.yml diff | blob | history
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