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[ARM GlobalISel] Remove redundant testcases. NFC
authorDiana Picus <diana.picus@linaro.org>
Wed, 25 Oct 2017 12:22:21 +0000 (12:22 +0000)
committerDiana Picus <diana.picus@linaro.org>
Wed, 25 Oct 2017 12:22:21 +0000 (12:22 +0000)
commit14c20baca7c838683e1568cb693bcaf5041d571c
treef39e18df6459cae1e67314d1bca98e873296a853tree | snapshot
parent88c6881256f78e77cf922f70e3015cfc04c4ce1ccommit | diff
[ARM GlobalISel] Remove redundant testcases. NFC

Remove the G_FADD testcases from arm-legalizer.mir, they are covered by
arm-legalizer-fp.mir (I probably forgot to delete them when I created
that test).

git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@316573 91177308-0d34-0410-b5e6-96231b3b80d8
test/CodeGen/ARM/GlobalISel/arm-legalizer.mir diff | blob | history
Unnamed repository; edit this file 'description' to name the repository.